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대한민국, 경기도, 여주군, 302-908 Bucheon-Technopark, Samjung-dong Ojung-Gu Bucheon Kyunggi-do
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Statec Inc.
Welcome to homepage of STATEC Inc.
STATEC Inc is venture corperation to develope semiconductor tester system.
Test expense is exceeded more than wafer manufacture expense in current situation
because, the most semi-conductor companies import an expensive test equipment of system LSI and Memory semi-conductor more than 90%.
We think Low expense and high quality tester make a semi-conductor competitive price improve, and it make a semi-conductor industry keep developing.
The semi-conductor tester is divided into a Handler which transfers semi-conductor and a Tester which tests electronic specification of the semi-conductor.
An assembly equipment and Handler was completed and recognized in localization of products, but the Tester is not yet.
The Tester(Auto Test Equipment) is High technology industry which needs high quality and high reliance so, a participation company is a few in a tester market.
STATEC has been recognized to the quality and reliance by exporting self-development system LSI tester.
STATEC tries to imporve ability of KOREA semi-conductor equipment to keep developing to low expense and high quality tester.
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QG150
The QG150 test system is Gate Charge Tester is designed.
Whethr you need a stand-alone tester, or a prober/handler marriage,
the user friendly interface, data logging, and test program editing options
make for simple operation.
Features
• Semiconductor Tester / Discrete...
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RG2009
Features
• Semiconductor Tester / Discrete Tester
• Gate Parasitic Resister
Resister : 0.3 ~ 50 Ω
DUT Capacitance : 400pF ~ 20nF
Sine-Wave Signal : 1 Mhz, 1Vpp, ±2V DC offset
• Gate Capacitance
Capacitance : 400pF ~ 20nF
Item : Ciss, Coss, Crss
Software
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SW6300A
The SW6300A switching tester is used to measure the switching time(TRR) of IGBT or
MOSFET fo TO-220 and TO-3P devices.
The tester reads the switching waveform from a digital oscilloscope.
Measurement of fail devices is avoided by detecting short, open, leak and excessive...
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STA2100
The STA2100 tester is a high performance test system for discrete semiconductor devices
such as high voltage Tranisistors, IGBTs, high current MOSFETs and Diodes.
This system is designed to small size compared with other competitive systems.
This electrical characteristics of...
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DM2000A
The DM2000A/B test device series is used to measure the thermal resistance characteristics
of the MOS-FETs, Transistors, IGBTs and Diodes.
The thermal resistance characteristics of the MOSFETs, Transistors, etc are
measured as the temperature change (㎷) of the PN junction....
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STA2050
The STA2050 tester is a high performanc test system for discrete semiconductor
dvieces such as high voltage Transistors/IGBTs and high current MOS-FETs/Diodes.
This system is designd to small size compard with other competitive systems.
This eeleectrical characteristics of devices...
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EAS2100V
The EAS2X00V test device series to guarantee the energy for switching during the Inductive load and performs ruggedness testing of power MOSFETs and IGBTs.
The EAS2X00V is the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels.
This is...
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